E.M. Tech - Electron Microscopy Laboratory at Montana Tech

Outreach 和 教育al goals

• Exposure to 和 use of the electron microscope will help inspire an interest in science, 技术, 工程, 和 mathematics (STEM) careers by K-12 students 和 teachers served by the Clark Fork Watershed Education Program (CFWEP) 和 the 蒙大拿州矿业局 和地质学.
• The ability to capture 和 convey the beauty of the biological, mineral 和 nano-scale worlds to K-12 students will spark interest in scientific careers, increase science literacy, 和 has the potential to combat scientific misinformation.
• E.M.Tech facility was established to significantly benefit state-wide outreach activities 和 underrepresented groups in Montana, including students from rural, economically disadvantaged areas, 和 Native American communities.
• The microscope’s images will engage students by visualizing 和 scientifically characterizing viruses, 矿物质, 纳米材料, as well as the results of environmental damage 和 restoration.
• Exposure to these electron microscopy capabilities will increase student recruitment 和 retention, increase entry to STEM careers, 和 strengthen science 和 技术 in Montana.

用户

• 教师 和 Researchers at Montana Tech 和 in the Montana University System
• Undergraduate 和 Graduate Student researchers at Montana Tech, including
• PhD students in Material Science 和 Earth Science 工程 at Montana Tech
• K-12 educators 和 students via Clark Fork Watershed Education Program (CFWEP)
• 蒙大拿州矿业局 和地质学
• Montana Tech Laboratory Courses
• Plans for commercial use are in development

E.M. 科技日立7820

2023年5月, courtesy of funding from the National ScienceFoundation (Award Number 2216488), the Montana Tech Department of Biological Sciences acquired a state-of-the-art Hitachi HT7820 scanning/transmission electron microscope. This 120 kV TEM has a “Dual Mode” compound objective lens system that can operate in either high contrast or high resolution (HC/HR) mode for st和ard TEM imaging. The HT7820 includes a Scanning Transmission Electron Microscope unit with both a brightfield 和 a darkfield detectors. 而TEM使用的是广义的, parallel electron beam to obtain an image of a sample the 扫描透射电镜 uses a focused beam to scan the sample line by line. This scanning technique provides an ultra-high-resolution image of a sample in either brightfield or darkfield view. 另外, the HT7820 will be equipped with an Oxford AZtecEnergy Energy Dispersive X-ray Spectroscopy (EDS) Microanalysis system. EDS will allow elemental identification, 本地化, 和 mapping of elements of interest in a sample.

E.M.技术是由博士管理. 吉姆的司机, an electron microscopist with over 15 years of experience in a variety of techniques for both scanning 和 transmission electron microscopy. Dr. 司机 will be available for consultation on sample collection 和 准备 for st和ard TEM imaging, 扫描透射电镜, EDS, 和 analysis using the Hitachi HT7820. Facility users will provide samples 和 reagents to capture images with user training 和 instrument support by Dr. 司机.

Plans for commercial use are in development. Interested commercial usersplease provide input as to your anticipated needs within the Microscope Anticipated Commercial Use Form.